Dispela OCV na Internal Resistance Tester i wok olsem wanpela bikpela tul bilong enjiniaring bilong mekim wok painimaut long ol sel na wok bilong skelim gut ol samting. Antap long besik skrining, dispela masin bilong testim ol bateri bilong 'lithium ion' i save givim ol bikpela tingting long 'failure analysis' long rot bilong skelim ol liklik senis long 'Open Circuit Voltage' (we i soim olsem kemikel i stap gut) wantaim ol stretpela 'internal resistance' mesamen (we i soim 'mechanical' na 'interfacial integrity').
Dispela instramen i gutpela tru long stretim gut ol wok, na i larim ol enjinia long luksave long ol senis we i kamap long 'electrode coating', 'calendaring', o 'formation parameters'. Wantaim ol tes sediul we yu ken stretim, bikpela stebiliti bilong skelim, na gutpela wok insait long ol MES sistem, em i givim ol data we yu ken mekim wok long en bilong skelim as bilong as na wok long kamap gutpela moa. Em i bikpela samting, i no long laspela kwaliti kontrol tasol, tasol tu long skelim ol 'raw materials', sekim ol 'cell batches', na stretim ol hevi bilong pefomens long olgeta taim bilong R&D, wokim ol samting, na 'field return analysis'.
Ol spesifikesen na skop bilong aplikesen
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sais |
Kompatibiliti ranj |
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Hait bilong sel (H) |
118~210mm |
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Bikpela bilong sel (W) |
130~173mm |
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Tiknes bilong sel (T) |
36~72mm |
Divais Komposisen
MODEL: SZO-OCV-SD-02
Dispela masin i gat tripela samting: wanpela 'scanning system', wanpela 'test fixture', na wanpela 'OCV testing system'.
Sken Kod Sistem
Skenim sel long han.
Bihain long yu skenim, putim ol data bilong sel i go long host kompyuta sofwet.
Traim robot han sistem
Test fiksa i gat wanpela masin bilong apim, wanpela masin bilong tes probe, na wanpela masin bilong putim sel.
Bihain long wok bilong skenim QR kod i pinis, 'positioning mechanism' bai putim 'battery cell'. Taim ol i pinisim wok bilong putim, han bilong robot bilong tes bai kam daun wantaim 'probe mechanism' long mekim wanpela 'Open-Circuit Voltage (OCV) tes long bateri sel.
Test pressing i bihainim pasin bilong silinda.
OCV Test System
Dispela sistem i gat ol samting bilong testim na ol kebol bilong testim.
Rot bilong mekim wok long ol masin
Kwolifikesen
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straksa bilong ol ikwipmen |
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namba bilong oda |
wok |
teknikel paramita |
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1 |
Namba bilong ol 'channel' bilong divais |
Traim 1-pela bateri long wan wan tes |
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2 |
Kala bilong masin |
Standet hat 1C (yu ken senisim) |
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3 |
wok pawa saplai |
AC220V±10% tripela-feis faiv-waia, 50HZ |
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4 |
wok envairomen |
Tempereja bilong ples: 10-40 digri; 'relative humidity': Liklik o wankain olsem 60% |
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5 |
As bilong win long wok |
0.5-0.8MPa |
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6 |
inap bilong plent |
Liklik o wankain olsem 1.0KW |
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7 |
hevi bilong ol ikwipmen |
Liklik o wankain olsem 500kg |
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Ogenaisesen bilong testim |
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namba bilong oda |
wok |
teknikel paramita |
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1 |
probe |
Nil bilong karent i gat ol 'serrated' na het bilong en i gat gol-plet long mekim karent i go pas na kisim 'voltage sampling' stret |
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2 |
Probe press count |
Bikpela o wankain olsem 20,000 taim |
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3 |
Probe kontek resistans |
Liklik o wankain olsem 5mΩ |
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OCV sistem |
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namba bilong oda |
wok |
teknikel paramita |
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1 |
testim kebol |
twisted shielded pair |
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2 |
tes instramentesen |
Sain i lait |
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3 |
Stretpela tes bilong voltej |
±(0.0035% set+0.0005% FS) |
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4 |
Voltej resolusen |
10μV |
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5 |
Intenel resistens tes ranj |
0-3mΩ |
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6 |
Intenel resistens tes |
±0.5%rdg.±10dgt |
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7 |
Intanel resistens resolusen |
0.1μΩ |
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8 |
GRR |
Liklik o wankain olsem 10% |
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9 |
Zero plet |
'Gong' karakta-seip disain [olsem i stap long BT3562's Namba Wan Edisen (A980-00) bilong Nippon Electric Co., Ltd., Apendiks 12, i tok klia long zero-adjustment prinsipol bilong 9454] |
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10 |
Intenel resistans masta blok |
Standat resistens veliu em 25 mΩ ± 0.5 mΩ |
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11 |
Lokal monitoring kompyuta |
Ol samting bilong stretim (Pati A i givim): Opereting sistem: Windows 10 o bihain Tok Saina: Simplified Chinese CPU: Intel Core i7 o antap moa Memori: 12GB o moa Hat disk: 1TB o moa Displei: 19 ins o moa LCD displei |