OCV na Internal Resistance Tester i wok olsem wanpela bikpela samting bilong skelim gut pefomens bilong ol sel na sekim kwaliti bilong ol. Dispela masin bilong testim ol litiam bateri i save skelim stret 'Open Circuit Voltage' (OCV) long painimaut stet-bilong-saj na painim ol hevi long 'self-discharge, na long wankain taim em i skelim pawa bilong sel long givim pawa long rot bilong stretpela intanel resistens (AC Impedance o DC{4}}IS. Dispela non-invasive daiagnostik em i bikpela samting long laipsaiklon bilong bateri.
Ol i wokim dispela masin bilong mekim planti samting, na em i save sapotim planti kain tes na i save givim bikpela spit, na i no senis senis wantaim gutpela stretpela mak bilong voltej (olsem, ±0.05% bilong riding) na resistens. Integreted sofwet bilong en i mekim gutpela data menesmen, SPC analisis, na 'seamless traceability' long rot bilong bungim ol tes risal i go long ol wanwan sel ID. Em i bikpela samting long R&D validesen, inspeksen bilong ol samting i kam insait, prodaksen lain skrining, na feilia analisis, dispela tul i mekim ol sel tasol i bihainim ol strongpela ilektrikel spesifikasen i go het long proses bilong wokim o ol i yusim long ol laspela asembli.
Model: SZO-OCV003
Ol spesifikesen na skop bilong aplikesen
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sais |
Kompatibiliti ranj |
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Hait bilong sel (H) |
118~210mm |
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Bikpela bilong sel (W) |
130~173mm |
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Tiknes bilong sel (T) |
36~72mm |
Divais Komposisen
Dispela masin i gat tripela samting: wanpela 'scanning system', wanpela 'test fixture', na wanpela 'OCV testing system'.
Sken Kod Sistem
Skenim sel long han.
Bihain long yu skenim, putim ol data bilong sel i go long host kompyuta sofwet.
Traim robot han sistem
Test fiksa i gat wanpela masin bilong apim, wanpela masin bilong tes probe, na wanpela masin bilong putim sel.
Bihain long wok bilong skenim QR kod i pinis, 'positioning mechanism' bai putim 'battery cell'. Taim ol i pinisim wok bilong putim, han bilong robot bilong tes bai kam daun wantaim 'probe mechanism' long mekim wanpela 'Open-Circuit Voltage (OCV) tes long bateri sel.
Test pressing i bihainim pasin bilong silinda.
OCV Test System
Dispela sistem i gat ol samting bilong testim na ol kebol bilong testim.
Rot bilong mekim wok long ol masin
Kwolifikesen
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straksa bilong ol ikwipmen |
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namba bilong oda |
wok |
teknikel paramita |
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1 |
Namba bilong ol 'channel' bilong divais |
Traim 1-pela bateri long wan wan tes |
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2 |
Kala bilong masin |
Standet hat 1C (yu ken senisim) |
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3 |
wok pawa saplai |
AC220V±10% tripela-feis faiv-waia, 50HZ |
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4 |
wok envairomen |
Tempereja bilong ples: 10-40 digri; 'relative humidity': Liklik o wankain olsem 60% |
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5 |
As bilong win long wok |
0.5-0.8MPa |
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6 |
inap bilong plent |
Liklik o wankain olsem 1.0KW |
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7 |
hevi bilong ol ikwipmen |
Liklik o wankain olsem 500kg |
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Ogenaisesen bilong testim |
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namba bilong oda |
wok |
teknikel paramita |
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1 |
probe |
Nil bilong karent i gat ol 'serrated' na het bilong en i gat gol-plet long mekim karent i go pas na kisim 'voltage sampling' stret |
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2 |
Probe press count |
Bikpela o wankain olsem 20,000 taim |
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3 |
Probe kontek resistans |
Liklik o wankain olsem 5mΩ |
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OCV sistem |
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namba bilong oda |
wok |
teknikel paramita |
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1 |
testim kebol |
twisted shielded pair |
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2 |
tes instramentesen |
Sain i lait |
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3 |
Stretpela tes bilong voltej |
±(0.0035% set+0.0005% FS) |
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4 |
Voltej resolusen |
10μV |
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5 |
Intenel resistens tes ranj |
0-3mΩ |
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6 |
Intenel resistens tes |
±0.5%rdg.±10dgt |
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7 |
Intanel resistens resolusen |
0.1μΩ |
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8 |
GRR |
Liklik o wankain olsem 10% |
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9 |
Zero plet |
'Gong' karakta-seip disain [olsem i stap long BT3562's Namba Wan Edisen (A980-00) bilong Nippon Electric Co., Ltd., Apendiks 12, i tok klia long zero-adjustment prinsipol bilong 9454] |
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10 |
Intenel resistans masta blok |
Standat resistens veliu em 25 mΩ ± 0.5 mΩ |
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11 |
Lokal monitoring kompyuta |
Ol samting bilong stretim (Pati A i givim): Opereting sistem: Windows 10 o bihain Tok Saina: Simplified Chinese CPU: Intel Core i7 o antap moa Memori: 12GB o moa Hat disk: 1TB o moa Displei: 19 ins o moa LCD displei |